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High Resolution Scanning Electron Microscope
FEI-Quanta FEG 200F is a versatile high resolution Scanning Electron Microscope.
Specifications:
Source: FEG assembly with Schottky emitter(-200V to 30kV)
Beam Current: >100nA
Resolution: 1.2nm(Gold nano particles suspended on Carbon substrate)
Magnification: 12X-105X
Mode: HighVacuum(for conductors), Low Vacuum(for insulators) and ESEM(for biospecimen)
Accessories available: EDX and WDS
Applications
- Surface analysis
- Materials evaluation
- Failure analysis
- Monitoring corrosion
- Particle distribution
- Structural analysis
| Sample Required |
Dimension (lxbxh) < 10 mm (button size) Non conducting samples will require gold coating. Powder samples : 10mg Magnetic samples should be pelletized.  For queries please contact 044-22575935 (HRSEM lab) |