VSM

Due to heavy backlog in the number of samples for VSM Characterisation no further samples will be accepted till 31st August 2016

HR-SEM - Internal Users

Application form for analyzing samples in HRSEM will not be accepted for Internal Users(IITM) till 30th Sep 2016. We sincerely regret the inconvenience caused.

HR-SEM

WDS Facility is currently under Technical Maintenance. We regret the inconvenience. we hope to make this facility available very soon.

Thermal Analysis DSC

Due to technical reasons DSC204 is currently operable only in the high temperature mode. Samples can be accepted only for high temperature measurements. DSC low temperature measurements cannot be carried out.

Samples

Users are requested to take back the remaining /recovered samples within 1 week from the date of receipt of the result; otherwise these samples will be discarded without further notice.

Important Announcement

Please note that in the event the DD amount/payment received is more than the actual analyses charges incurred, it will NOT be possible to refund the excess amount paid. However, the excess amount may be adjusted against future analyses by the same user or another user from the same organization following a written request by Email or hard copy.
 

About SAIF

    The Sophisticated Analytical Instruments Facility (SAIF), formerly known as RSIC, was established by Department of Science and Technology (DST). This is the first among the seven RSIC's established subsequently by DST. The purpose of establishing these centres is to provide data collection facility from sophisticated analytical equipments to scientific community for their advanced research with nominal charges. The facility has grown into a major centre for spectral measurements, molecular and crystal structure determination and materials characterization.


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