VSM

Due to technical reasons VSM samples will not be accepted from 25th April 2016 to 16th May 2016.

ESR

Due to technical reasons ESR Spectrometer VT Measurements currently not operable until further notice.

HR-SEM

Due to heavy backlog of samples for HR-SEM measurement we are not accepting fresh Internal sample till 30th April 2016.

TG-DSC

Due to heavy backlog of samples for TG-DSC measurement we are not accepting fresh samples untill further notice.

Thermal Analysis DSC

Due to technical reasons DSC204 is currently operable only in the high temperature mode. Samples can be accepted only for high temperature measurements. DSC low temperature measurements cannot be carried out.

VSM samples may be submitted

Lakeshore model 7410 Vibrating Sample Magnetometer(VSM) for magnetic susceptibility measurements is back in operation (for Room temperature and High temperature measurements only). Low temperature samples will not be accepted until further notice. Please submit your samples as per the standard procedure.

Samples

Users are requested to take back the remaining /recovered samples within 1 week from the date of receipt of the result; otherwise these samples will be discarded without further notice.

Important Announcement

Please note that in the event the DD amount/payment received is more than the actual analyses charges incurred, it will NOT be possible to refund the excess amount paid. However, the excess amount may be adjusted against future analyses by the same user or another user from the same organization following a written request by Email or hard copy.
 

About SAIF

    The Sophisticated Analytical Instruments Facility (SAIF), formerly known as RSIC, was established by Department of Science and Technology (DST). This is the first among the seven RSIC's established subsequently by DST. The purpose of establishing these centres is to provide data collection facility from sophisticated analytical equipments to scientific community for their advanced research with nominal charges. The facility has grown into a major centre for spectral measurements, molecular and crystal structure determination and materials characterization.


Workshop Announcement
Next Workshop will be Announced Shortly ....
Instrument Status
Click Here
Feedback for DST
click here
Online Requisition Form

  Home |  Objectives |  Administration |  Facilities |  Charges list |  Personnel |  Download |  Alumni |  Contact us  
       
    powered by Jeeva A, Shajin L © 2009 All Rights Reserved, SAIF IITM