Thermal Analysis DSC

Due to technical problems we are not in a position to accept samples for DSC until further notice.

CAD4 XRD

The CAD4 single crystal diffractometer is down and is currently under repair. Hence, the registration for morphology measurements are temporarily suspended.

Jobin Yvon Fluorimeter

Due to technical problems we are not in a position to accept samples for PL studies until further notice.

VSM samples may be submitted

Lakeshore model 7410 Vibrating Sample Magnetometer(VSM) for magnetic susceptibility measurements is back in operation (for both room temperature as well as low temperature studies). Please submit your samples as per the standard procedure.

TG-DSC

Due to heavy backlog of samples for TG-DSC measurement we are not in a position to accept fresh samples until further notice.

Samples

Users are requested to take back the remaining /recovered samples within 1 week from the date of receipt of the result; otherwise these samples will be discarded without further notice.

Important Announcement

Please note that in the event the DD amount/payment received is more than the actual analyses charges incurred, it will NOT be possible to refund the excess amount paid. However, the excess amount may be adjusted against future analyses by the same user or another user from the same organization following a written request by Email or hard copy.
 

About SAIF

    The Sophisticated Analytical Instruments Facility (SAIF), formerly known as RSIC, was established by Department of Science and Technology (DST). This is the first among the seven RSIC's established subsequently by DST. The purpose of establishing these centres is to provide data collection facility from sophisticated analytical equipments to scientific community for their advanced research with nominal charges. The facility has grown into a major centre for spectral measurements, molecular and crystal structure determination and materials characterization.


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