
An Important notice
As per the guidelines of the Department of Science and Technology (DST),
in all publications of research work, where in the analytical services of the
SAIF have been made use of, the DST and the SAIF, IIT Madras shall be duly
acknowledged. Kindly send us the publication reference (Journal name/volume
number/names of the authors/date of issue of the publication etc) to us.
A list of charges for spectral measurements, as stipulated by the Department of Science & Technology, New Delhi, is annexed. A "Three Tier" Charge System is being followed. Please note that :
Please note the current policy on payment of analysis charges: Our
current policy requires analysis that payment be received before the samples can be
registered and analysis taken up. Please make sure that the payment is received along
with the samples.
Please note that in the event the amount/payment received is more
than the actual analyses charges incurred, it will NOT be possible to refund the excess
amount paid. However, the excess amount may be adjusted against future analyses by the
same user or another user from IIT following a written request by Email or hard copy.
|
|||||||
|
|||||||
SL.NO |
Facility
|
Department of Recurring Grant
|
Project/Reimbursement
|
||||
SPECTROMETRY
|
|||||||
1. | FT-NMR spectrometer
(Solution State) Extra charges for deuterated solvents
|
1 H, 19 F, 31 P, 27 Al, 11 B & DEPT
|
|
.
|
|||
13C
|
|
|
|||||
77Se, 125Te, 95Mo, 29Si
|
|
|
|||||
VT - HT |
|
|
|||||
VT - LT |
|
|
|||||
2D: COSY, HSQC |
|
|
|||||
2D: DQFCOSY, HMBC, TOCSY
|
|
|
|||||
2D:NOESY ⁄ ROESY
|
|
|
|||||
Solvent Charges:- CDCl3
|
|
|
|||||
Solvent Charges:- METHANOL - D4
|
|
|
|||||
Solvent Charges:- DMSO, BENZENE, D2O, ACETONE
|
|
|
|||||
2. | FT-NMR spectrometer
(Solid State)
|
|
|
||||
ESR Spectrometer
|
|||||||
ESR Microwave Frequency
|
Measurement Temperature
|
Nature of Sample
|
Feasible/
Not Feasible |
Measuremnet Charges
|
|||
3. |
ESR Microwave Frequency
X Band
|
Room Temperature
|
Powder
|
Y
|
|
|
|
Solution/Liquid
|
Y
|
||||||
Crystal/Pellet/Thin Film
|
Y
|
||||||
Liquid Nitrogen Temperature(77.3K)
|
Powder
|
Y
|
|
|
|||
Solution/Liquid
|
Y
|
||||||
Crystal/Pellet/Thin Film
|
Y
|
||||||
Variable Temperature
|
Powder
|
Y
|
|
|
|||
Solution/Liquid
|
N
|
||||||
Crystal/Pellet/Thin Film
|
Y
|
ESR Microwave Frequency
X Band ENDOR
|
Room Temperature
|
Powder
|
Y
|
Rate not fixed
|
|
Liquid Nitrogen Temperature
|
Solution/Liquid
|
||||||
Variable Temperature
|
Crystal/Pellet/Thin Film
|
Y
|
|
|
|||
ESR Microwave Frequency
Q Band
|
Room Temperature
|
Powder
|
Y
|
|
|
||
Solution/Liquid
|
Y
|
||||||
Crystal/Pellet/Thin Film
|
Y
|
||||||
Liquid Nitrogen Temperature(77.3K)
|
Powder
|
N
|
Nil
|
Nil
|
|||
Solution/Liquid
|
N
|
||||||
Crystal/Pellet/Thin Film
|
N
|
||||||
Variable Temperature
|
Powder
|
Y
|
|
|
|||
Solution/Liquid
|
|||||||
Crystal/Pellet/Thin Film
|
Y
|
||||||
4. | ICP-OES | Analysis cost for first element |
Analysis cost for first element |
||||
5. | LIFE TIME
SYSTEM (Please click the link before submitting the samples for specialized measurements) |
Single experiment
|
|
|
*Quenching studies
|
|
|
FRET
|
|
|
6. | UV-VIS-NIR spectrometer |
UV-VIS only
|
|
|
UV-VIS-NIR
|
|
|
7. | Fluorescence
spectrometer (Please click the link before submitting the samples for specialized measurements) |
Excitation/emission Spectrum
|
|
|
Synchronous Scanning
|
|
|
Excitation-Emission Matrix
|
|
|
*Quantum yield measurement(for liquid
sample only)
|
|
|
*Quenching studies
|
|
|
*Solvatochormism studies
|
|
|
*FRET study
|
|
|
8. |
FT-RAMAN spectrometer
|
[Included Preparation charges] |
[Included Preparation charges] |
||||
9. |
FT-IR spectrometer
per spectrum per sample
|
MID-IR (400 Cm-1 - 4000 Cm-1)
|
[Included Preparation charges] |
[Included Preparation charges] |
|||
FAR-IR (100 Cm-1 - 600 Cm-1)
|
[Included Preparation charges] |
[Included Preparation charges] |
|||||
MID & FAR (100 Cm-1 - 4000 Cm-1)
|
[Included Preparation charges] |
[Included Preparation charges] |
|||||
FULL RANGE (100 Cm-1 - 8000 Cm-1)
|
[Included Preparation charges] |
[Included Preparation charges] |
|||||
CRYSTALLOGRAPHY
|
|||||||
10. | Single crystal X-Ray
Diffractometer (XRD)
For structure determination charges are extra. (Pl. contact the operator)
|
Cell Parameters
|
|
|
Cell parameter and Crystal Structure Data base check
|
|
|
Data Collection
|
|
|
|
|
Data at low temperature
|
|
|
Data & structure at low tempurature
|
|
|
Structure solution only(SC-XRD DATA SHOULD BE PROVIDED)
|
|
|
|||||
IMAGING
|
|||||||
11. | FEI Quanta FEG 200-High Resolution Scanning Electron Microscope (SEM) |
*SEM Image
|
|
|
|||
*SEM Image + EDAX
|
|
|
|||||
*SEM Image + EDAX +
Mapping
|
|
|
|||||
*SEM Image + EDAX +
WDS(Not Working)
|
|
|
|||||
*Additional Charges for
Gold Coating
|
|||||||
MAGNETOMETRY |
|||||||
12. |
Vibrating Sample Magnetometer (VSM)
(Revised Charges) |
RT (up to ± 1.5T)
|
|
|
|||
RT (up to ± 2.5T)
|
|
|
|||||
Low Temp
|
-T at any fixed magnetic field (or) |
M-T at any fixed magnetic field (or) |
|||||
High Temp
|
M-T at any one fixed magnetic field (or)
M-H at any one fixed High temp @ |
M-T at any one fixed magnetic field (or) M-H at any one fixed High temp
@
|
|||||
THERMAL ANALYSIS
|
|||||||
13. | DSC (These charges correspond to a standard heating rate 10°k/min) per measurement |
||||||
High Temp
RT to 400°C
|
Heating only
Heating and Cooling
|
Heating only
Heating and Cooling
|
|||||
Low Temp
-70°C to +70°C
|
Heating only
Heating and Cooling
|
Heating only
Heating and Cooling
|
|||||
Cp(Specific heat capacity
Measurement)
35°C to 400°C
|
|
|
|||||
14. | TG – DSC (These charges correspond to a standard heating rate 10°k/min) Including Charges for Alumina Crucibles Rs 220 |
||||||
Temp
RT to 1400°C
|
|
|
|||||
ELEMENTAL ANALYSIS
|
|||||||
15. | CHNSO ANALYSER |
CS744*
|
|
|
ONH836*
|
|
|
Truspec Micro CHNS Module*
|
|
|
Truspec Micro Oxygen Module
|
|
|
CHROMATOGRAPHY
|
|||||||
16. | GC-MS (Single Quad) |
GC-MS (Electron Ionization)
|
|
|
GC-MS (Chemical Ionization)
|
|
|
GC-MS (Electron Ionization) with NIST Library search
|
|
|
17. | LC-QTOF-HRMS Positive and Negative ionization modes (per ionization modes) |
MS (ESI mode)
|
|
|
MS (ESCi mode)
|
|
|
MS (ASAP mode)
|
|
|
HR-MS (ESI)
|
|
|
HR-MS (ESCi)
|
|
|
MS/MS
|
|
|
UPLC (PDA/Fast DDA)
|
|
|
UPLC (MS/MSE)
|
|
|
UPLC-HRMS
|
|
|
TOF-MRM
|
|
|
Additional Charges may be levied for: |
|
The Head |
SAIF IIT Madras |
Chennai 600 036. |
Phone No.2257 4935, Fax: 2257 0509/2257 2545 |
E-mail: saif at iitm.ac.in |
saif at iitm.ac.in |