VARIAN E-4 ESR SPECTROMETER

Varian E-4 EPR Spectrometer is under conversion to FT-EPR spectrometer.
Details will be made available when the instrument is fully operative.

Read More >>>

ENRAF (BRUKER) NONIUS CAD4 SINGLE CRYSTAL X-RAY DIFFRACTOMETER

The molecular structure, atomic coordinates, bond lengths, bond angles, molecular orientation and packing of molecules in single crystals can be determined by X-ray crystallography. Single crystal X-ray diffractometer collects intensity data required for structure determination

Read More >>>

Single crystal X-ray diffractometer

Single-crystal X-ray Diffraction is a non-destructive analytical technique which provides detailed information about the internal lattice of crystalline substances, including unit cell dimensions, b

Read More >>>

FINNIGAN MAT 8230 MASS SPECTROMETER

Mass spectrometry has become a vital tool in the hands of organic chemists and biochemists because of its potential to supply definitive, qualitative

Read More >>>

 

 

 

F E I Quanta FEG 200 - High Resolution Scanning Electron Microscope

The Quanta 200 FEG scanning electron microscope (SEM) is a versatile high resolution scanning electron microscope with three modes of operation, namely, the high vacuum (HV) mode for metallic (electrically conducting) sample, low vacuum (LV) and environment scanning electron microscope (ESEM) modes for insulating, ceramic, polymeric (electrically insulating) and biological samples respectively. Apart from giving the high resolution surface morphological images, the Quanta 200 FEG also has the analytical capabilities such as detecting the presence of elements down to boron (B) on any solid conducting materials through the energy dispersive X-ray spectrometry (EDX) providing crystalline information from the few nano meter depth of the material surface via electron back scattered detection (BSD) system attached with microscope and advanced technological PBS (WDS) for elemental analysis.

Resolution: 1.2 nm gold particle separation on a carbon substrate

Magnification: From a min of 12x to greater than 1, 00,000 X



    APPLICATION INCLUDE

Materials evaluation

  • Grain size
  • Particle size distributions
  • Material homogeneity
  • Inter metallic distribution

 

Failure analysis

  • Contamination location
  • Mechanical damage assessment
  • Micro-crack location

 

Quality Control screening

  • “Good” to “bad” sample
  • comparison
  • Dimension verification
  • Gate width measurement

 

Sample required

General Size:. Any dimension (Height or Diameter): Less than 10 mm. The ideal shape of a sample is that of a button on your shirt. However, other sizes can also be accommodated only after a discussion with the system operator.

Conductivity (Electrical):Conducting or at least semiconducting. If sample is not electrically conducting, it will require silver or gold coating. If the sample is a powder, make a normal button size pellet of the powder. If the sample is insulator or polymeric or electrically non-conducting it needs to be coated with carbon

Wavelength Dispersive Spectroscopy (WDS) accessory to HR-SEM

Utility:. This accessory is used for determining % concentration of elements on the surface of metallic specimen.

Limitation:A minimum of about 1000 ppm concentration of each element is required for detection on a metallic specimen of preferred size with finely polished suface.

Interested users can contact the scientist-in-charge, Mr.Sivaramakrishnan.
  Home |  Personnel |  Alumni |  Chargeslist |  Objectives |  Administration |  Facilities | Application Form |  Contactus  
       
    powered by Jeeva A, Shajin L © 2009 All Rights Reserved, SAIF IITM